The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Jul. 11, 2011
Applicants:

Takashi Majima, Utsunomiya, JP;

Hideki Kumagai, Utsunomiya, JP;

Kazumi Mizukami, Mooka, JP;

Tomohiro Usui, Utsunomiya, JP;

Inventors:

Takashi Majima, Utsunomiya, JP;

Hideki Kumagai, Utsunomiya, JP;

Kazumi Mizukami, Mooka, JP;

Tomohiro Usui, Utsunomiya, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the present invention, a three-dimensional measuring instrument includes a spindle that moves an object to be controlled in a predetermined axis direction; and a controlling device that controls a position of the object to be controlled by controlling a position of the spindle. The three-dimensional measuring instrument further includes an absolute-type linear encoder that outputs an absolute position of the spindle. With this, it is possible to start measurement by the three-dimensional measuring instrument in a short period of time.


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