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For the Inventor, By the Inventor

Tenri, Japan

Hideaki Sakaguchi

This inventor holds 5 USPTO granted patents. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 1995-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideaki Sakaguchi. Retrieved from https://idiyas.com/inventor/hideaki-sakaguchi-pvk7lh6b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 5

% Patents Active = 60.0

Average Co-Inventor Count = 1.3

ph-index = 4

Forward Citations = 31(Granted Patents)


Company Filing History:

goldMedal5 out of 25,982 
 
Sharp Kabushiki Kaisha Corporation
 patents

Years Active: 1995-2005

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5 patents (USPTO):Explore Patents
1. 6850085 - Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit (2005-02-01),
2. 6833715 - Semiconductor testing apparatus and semiconductor testing method (2004-12-21),
3. 6766266 - Testing device and testing method for semiconductor integrated circuits (2004-07-20),
4. 6535011 - Testing device and testing method for a semiconductor integrated circuit and storage medium having the testing program stored therein (2003-03-18),
5. 5473619 - Method and apparatus for testing a driving circuit (1995-12-05),

Title: Innovations by Hideaki Sakaguchi

Introduction

Hideaki Sakaguchi is a notable inventor based in Tenri, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on enhancing the efficiency and accuracy of semiconductor testing devices.

Latest Patents

Sakaguchi's latest patents include a reference voltage generating device, a semiconductor integrated circuit that incorporates this device, and a testing device and method for semiconductor integrated circuits. The testing device is designed to determine whether the output voltage of a liquid crystal driver LSI is at the proper level. It features a differential amplifier array module and an expected value voltage generator that produces expected value data through interpolation. This innovation allows for rapid and precise testing of output voltages in devices under test.

Another significant patent involves a semiconductor testing apparatus and method that enable precise acceptance-or-rejection determinations for semiconductor integrated circuits with numerous output terminals. This apparatus includes various components such as an output voltage testing device and a comparison voltage generation data inputting device, ensuring accurate voltage comparisons.

Career Highlights

Sakaguchi is currently employed at Sharp Kabushiki Kaisha Corporation, where he continues to develop innovative technologies in the semiconductor field. His work has been instrumental in advancing testing methodologies that enhance the reliability of semiconductor devices.

Collaborations

He has collaborated with notable colleagues, including Masami Mori and Masayuki Ehiro, contributing to the development of cutting-edge technologies in their field.

Conclusion

Hideaki Sakaguchi's contributions to semiconductor technology through his patents and innovations have significantly impacted the industry. His work exemplifies the importance of precision and efficiency in semiconductor testing, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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