The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

Jul. 21, 2000
Applicant:
Inventor:

Hideaki Sakaguchi, Tenri, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

A testing device tests a LCD driver LSI which incorporates a multiple number of D/A converters and outputs voltages from the D/A converters via associated output terminals. A voltage meter measures a multiple levels of tonal voltages output from the first output terminal and calculates the differential voltage value between each measured voltage and the associated expected voltage. Each differential amplifier has an input for receiving the output voltage output from the first output terminal in common and another input for receiving the output voltage output from one output terminal other than the first output terminal. A comparator receives the amplified differential voltages output from the plural differential amplifiers and checks whether the amplified differential voltages from the differential amplifiers fall within given voltage ranges, receptively.


Find Patent Forward Citations

Quick Actions:

Sakaguchi, Hideaki. (2003). Testing device and testing method for a semiconductor integrated circuit and storage medium having the testing program stored therein (U.S. Patent No. 6535011). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6535011

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…