The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Jul. 21, 2000
Applicant:
Inventor:

Hideaki Sakaguchi, Tenri, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/114 ;
U.S. Cl.
CPC ...
G01R 3/114 ;
Abstract

A testing device for LCD driver LSIs, includes: a voltage generator which generates a multiple number of expected voltages to be compared to each output voltage output from each of the output terminals and can selectively output multiple sets of reference voltages required for testing multiple kinds of semiconductor integrated circuits; a multiple number of differential amplifiers, each having two input terminals, one for receiving the output voltage output from each of the output terminals and the other for receiving the reference voltage from the reference voltage generator; and a comparator that receives the amplified output voltages from the multiple number of differential amplifiers and judges whether the amplified output voltage from each differential amplifier falls within the given voltage range.


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Sakaguchi, Hideaki. (2004). Testing device and testing method for semiconductor integrated circuits (U.S. Patent No. 6766266). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6766266

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