Company Filing History:
Years Active: 2015-2016
Title: Innovations of Hideaki Nishida
Introduction
Hideaki Nishida is a prominent inventor based in Chino, Japan. He has made significant contributions to the field of sample analysis technology, holding a total of 2 patents. His work focuses on enhancing the capabilities of devices used for analyzing samples through innovative designs.
Latest Patents
Nishida's latest patents include a "Sample analysis element and detection device" and a "Sample analysis device, testing apparatus, and sensor cartridge." The sample analysis element is designed to unite a propagating surface plasmon resonance with a localized surface plasmon resonance, thereby increasing the surface density of hot spots. This element features multiple metal nanobody lines, each containing a series of metal nanobodies arranged on a dielectric surface at a pitch smaller than the wavelength of incident light. The arrangement of these lines in parallel at a larger pitch enhances the device's analytical capabilities.
The sample analysis device aims to enhance near-field light while increasing hotspot areal density. It consists of multiple nanostructures arranged on the surface of a base body, with each nanostructure covered by a metal film. The nanostructures are organized into lines, with a specific arrangement that optimizes their performance in sample analysis.
Career Highlights
Hideaki Nishida is currently employed at Seiko Epson Corporation, where he continues to innovate in the field of sample analysis technology. His work has been instrumental in developing advanced analytical devices that leverage nanotechnology.
Collaborations
Nishida collaborates with notable colleagues, including Mamoru Sugimoto and Jun Amako, who contribute to the research and development efforts at Seiko Epson Corporation.
Conclusion
Hideaki Nishida's contributions to sample analysis technology through his innovative patents and collaborative efforts highlight his role as a key inventor in this field. His work continues to push the boundaries of what is possible in analytical device technology.
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