The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Apr. 12, 2013
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Mamoru Sugimoto, Chino, JP;

Jun Amako, Shiki, JP;

Hideaki Nishida, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/552 (2014.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G01N 21/658 (2013.01); G01N 2201/06113 (2013.01);
Abstract

There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.


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