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For the Inventor, By the Inventor

Kawasaki, Japan

Hidaki Takizawa

This inventor holds 9 USPTO granted patents. Top assignees: Sharp Kabushiki Kaisha Corporation, Fujitsu Corporation, Fujitsu Display Technologies Corporation. Active years: 1998-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidaki Takizawa. Retrieved from https://idiyas.com/inventor/hidaki-takizawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 9

% Patents Active = 33.3

Average Co-Inventor Count = 5.0

ph-index = 3

Forward Citations = 49(Granted Patents)


Company Filing History:

goldMedal5 out of 25,954 
 
Sharp Kabushiki Kaisha Corporation
 patents
silverMedal3 out of 39,374 
 
Fujitsu Corporation
 patents
bronzeMedal1 out of 103 
 
Fujitsu Display Technologies Corporation
 patents

Years Active: 1998-2013

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9 patents (USPTO):Explore Patents
1. 8592816 - Thin film transistor matrix device including first and second connection lines (2013-11-26),
2. 8258513 - Thin film transistor matrix device including first and second connection lines (2012-09-04),
3. 7947983 - Thin film transistor matrix device including first and second conducting connections formed outside an image display region (2011-05-24),
4. 7947982 - Thin film transistor matrix device including a plurality of thin film transistors arranged on the substrate (2011-05-24),
5. 7575960 - Method for fabricating a thin film transistor matrix device (2009-08-18),
6. 7075108 - Thin film transistor matrix device (2006-07-11),
7. 6767754 - Thin film transistor matrix device and method for fabricating the same (2004-07-27),
8. 6406946 - Thin film transistor matrix device and method for fabricating the same (2002-06-18),
9. 5742074 - Thin film transistor matrix device and method for fabricating the same (1998-04-21),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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