Heng Yie Chan

Title: Heng Yie Chan and Logic-Based Memory Screening.

Introduction

Heng Yie Chan is an inventor associated with Singapore and Micron Technology Incorporated. His patent work addresses the screening of defective memory components through logic-based methods.

Latest Patents

Chan is associated with one patent, titled “Logic-Based Defective Memory Component Screening.” The invention describes methods and systems for identifying defective bytes in memory organized into separately accessible chunks. A defectivity manager maps defective bytes from the physical domain to sub-segments in the logical domain. It then determines whether the bytes allocated for repair can accommodate the defects in a sub-segment and, when they can, writes the defective byte’s address to a portion of memory for repair. This approach connects physical memory defects with logical memory organization to support component screening and repair.

Career Highlights

Chan’s listed patent is associated with Micron Technology Incorporated, a company focused on memory and semiconductor technologies. The available information identifies his contribution in the area of memory defect screening.

Collaborations

Chan’s coworker is identified as Zimu Guo. The provided information does not specify further details about their collaboration.

Conclusion

Heng Yie Chan’s patent describes a logic-based approach to mapping and screening defective memory bytes, reflecting his work in memory technology at Micron Technology Incorporated.