Logic-based defective memory component screening

Abstract

Exemplary methods, apparatuses, and systems include logic-based defective memory component screening. A defectivity manager reads a defective byte map of memory having separately accessible chunks of memory. Each chunk of memory has a number of bytes addressable in a physical and logical domain. Each chunk of the memory is allocated a number of bytes to repair defective bytes. The defectivity manager maps a number of defective bytes in a chunk of a memory in the physical domain to a number of sub-segments of the memory in the logical domain. The defectivity manager writes, to a portion of the memory, an address of a defective byte in the chunk of the memory for repair in response to determining that an available number of bytes allocated to repair defective bytes satisfies a number of defective bytes in a sub-segment of the number of sub-segments of the memory in the logical domain.