Haojie Xia

Title: Haojie Xia: Innovator in Measurement Systems

Introduction

Haojie Xia is a prominent inventor based in Anhui, China. He has made significant contributions to the field of measurement systems, holding a total of 3 patents. His work focuses on advanced technologies that enhance measurement accuracy and efficiency.

Latest Patents

Haojie Xia's latest patents include a "Measurement system for detecting deep-hole surface topography based on low-coherence interferometry." This innovative system features a detection part that includes a white light interferometric system, which consists of a 1550 nm amplified spontaneous emission (ASE) broadband light source, reflectors, and a near-infrared camera. The system is designed to measure the surface topography of deep holes with high precision.

Another notable patent is the "Micro-displacement measurement system having picometer scale resolution and measurement method." This system comprises a probe module, demodulation optical path module, static lock-in amplification module, upper computer module, and a micro-displacement drive module. It utilizes advanced components such as a measurement FBG sensor and a piezoelectric ceramic nano-positioner to achieve picometer scale resolution.

Career Highlights

Haojie Xia is affiliated with Hefei University of Technology, where he continues to advance his research and development in measurement technologies. His work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

Haojie Xia collaborates with notable colleagues, including Liandong Yu and Fangfang Liu. Their combined expertise contributes to the success of their projects and enhances the research output at their institution.

Conclusion

Haojie Xia is a distinguished inventor whose work in measurement systems has led to significant advancements in technology. His patents reflect a commitment to innovation and precision in measurement techniques.