Hanno Kaupp

Title: Hanno Kaupp - Innovator in Charged Particle Beam Technology

Introduction

Hanno Kaupp is a notable inventor based in Erding, Germany. He has made significant contributions to the field of charged particle beam technology, particularly in the development of devices used for inspecting specimens. His innovative work has led to the creation of a patent that showcases his expertise and creativity.

Latest Patents

Hanno Kaupp holds a patent for a charged particle beam device, which includes an objective lens module, an electrode device, and a method for inspecting a specimen. This device features a beam source that emits a charged particle beam, an electrode that influences the beam, and a damping unit designed to reduce vibrations of the electrode. Additionally, the objective lens module incorporates an electrode with a damping unit, and the electrode device includes a mass damper mounted on a disk-shaped electrode body.

Career Highlights

Hanno Kaupp is associated with Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh, where he applies his knowledge and skills in semiconductor testing. His work in this company has allowed him to further develop his inventions and contribute to advancements in the field.

Collaborations

Hanno Kaupp has collaborated with notable colleagues, including Matthias Firnkes and John Breuer. Their teamwork has fostered an environment of innovation and has led to the successful development of new technologies in their field.

Conclusion

Hanno Kaupp's contributions to charged particle beam technology exemplify his dedication to innovation and excellence. His patent and work at Ict Integrated Circuit Testing highlight his role as a key figure in advancing semiconductor inspection methods.