Hannes Loferer

Title: Hannes Loferer: Innovator in Optical Measurement Technologies

Introduction

Hannes Loferer is a notable inventor based in Ortenburg, Germany. He has made significant contributions to the field of optical measurement technologies, holding two patents that showcase his innovative approach to measurement systems.

Latest Patents

Hannes Loferer's latest patents include a method and device for optically measuring the surface of a measurement object. This method involves generating image light with a specific pattern, projecting it onto the measurement object, and recording the influenced light that results from the interaction. The influenced light is captured by a device, and a correcting function is applied to ensure that the recorded image pattern maintains a consistent brightness. His second patent focuses on a reference plate and method for calibrating and checking a deflectometry sensor system. This reference plate features a reflective surface with a predefined pattern, which is essential for verifying system parameters of the sensor system.

Career Highlights

Hannes Loferer is associated with Micro-Epsilon Messtechnik GmbH & Co. KG, a company renowned for its precision measurement technology. His work at this company has allowed him to develop and refine innovative measurement solutions that are widely recognized in the industry.

Collaborations

Hannes has collaborated with notable colleagues such as Rainer Hesse and Robert Wagner. Their combined expertise has contributed to advancements in measurement technologies and has fostered a collaborative environment for innovation.

Conclusion

Hannes Loferer stands out as an influential inventor in the realm of optical measurement technologies. His patents reflect a commitment to enhancing measurement accuracy and efficiency. His contributions continue to impact the industry positively.