The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
May. 18, 2018
Micro-epsilon Messtechnik Gmbh & Co. KG, Ortenburg, DE;
Hannes Loferer, Ortenburg, DE;
Reiner Kickingereder, Ortenburg, DE;
Josef Reitberger, Rinchnach, DE;
Rainer Hesse, Ortenburg, DE;
Robert Wagner, Neuburg am Inn, DE;
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG, Ortenburg, DE;
Abstract
A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.