The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Oct. 05, 2017
Micro-epsilon Messtechnik Gmbh & Co. KG, Ortenburg, DE;
Stephan Zweckinger, FĂĽrstenstein, DE;
Josef Hochleitner, Tiefenbach, DE;
Hannes Loferer, Ortenburg, DE;
Robert Wagner, Neuburg am Inn, DE;
Rainer Hesse, Ortenburg, DE;
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG, Ortenburg, DE;
Abstract
The disclosure relates to a reference plate for calibrating and/or checking a deflectometry sensor system, said deflectometry sensor system including an image generation device and a capturing device having at least one capturing element, wherein the reference plate includes a reflective surface, and wherein, for the purpose of checking at least one system parameter of said deflectometry sensor system, the reflective surface is provided with a predefined pattern including markings. A corresponding method for calibrating and/or checking a deflectometry sensor system is moreover indicated.