This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Micro-Epsilon Messtechnik Gmbh & Co. Kg. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Josef Hochleitner: Innovator in Deflectometry Sensor Systems
Introduction
Josef Hochleitner is a notable inventor based in Tiefenbach, Germany. He has made significant contributions to the field of sensor technology, particularly in the calibration and checking of deflectometry sensor systems. His innovative approach has led to the development of a unique patent that enhances the accuracy and reliability of these systems.
Latest Patents
Hochleitner holds a patent for a reference plate and method for calibrating and/or checking a deflectometry sensor system. This patent describes a reference plate that includes a reflective surface, which is designed to check at least one system parameter of the deflectometry sensor system. The reflective surface is equipped with a predefined pattern that includes markings, allowing for precise calibration and verification of the sensor system's performance.
Career Highlights
Josef Hochleitner is associated with Micro-Epsilon Messtechnik GmbH & Co. KG, a company renowned for its advanced measurement technology. His work at this company has positioned him as a key player in the development of innovative sensor solutions. His expertise in deflectometry has contributed to the company's reputation for excellence in measurement technology.
Collaborations
Hochleitner collaborates with talented professionals such as Stephan Zweckinger and Hannes Loferer. Together, they work on advancing sensor technology and improving calibration methods, further enhancing the capabilities of deflectometry sensor systems.
Conclusion
Josef Hochleitner's contributions to the field of sensor technology, particularly through his patent for a reference plate, demonstrate his commitment to innovation and excellence. His work continues to influence the development of accurate and reliable measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
