This inventor holds 1 USPTO granted patent. Top assignee: Wacker Siltronic Gesellschaft Fur Halbleitermaterialien Ag. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Hannes Frischat: Innovator in Surface Examination Technology
Introduction
Hannes Frischat is a notable inventor based in Hanover, Germany. He has made significant contributions to the field of surface examination technology. His innovative approach has led to the development of a unique device that enhances the accuracy of surface analysis.
Latest Patents
Hannes Frischat holds a patent for a "Device and method for examining the smoothness of a sample surface." This device utilizes a scattered-light instrument to scan surfaces with a focused laser beam. It detects scattered light reflected during the scanning process. Additionally, the device includes an instrument for microscopic examination of light-scattering regions identified by the scattered-light instrument. The design features an evacuable sample chamber, where samples are placed on a holder, and a transparent window allows the laser beam to pass through before striking the sample surface.
Career Highlights
Hannes Frischat is associated with Wacker Siltronic Gesellschaft für Halbleitermaterialien AG, a company known for its advancements in semiconductor materials. His work has been instrumental in improving the methodologies used in surface examination, which is crucial for various applications in technology and manufacturing.
Collaborations
Hannes has collaborated with notable colleagues, including Martin Henzler and Ralf Kumpe. Their combined expertise has contributed to the successful development and implementation of innovative technologies in their field.
Conclusion
Hannes Frischat's contributions to surface examination technology exemplify the impact of innovation in scientific research and industrial applications. His patented device represents a significant advancement in the ability to analyze surface smoothness effectively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
