The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2000

Filed:

Feb. 18, 1998
Applicant:
Inventors:

Martin Henzler, Garbsen, DE;

Ralf Kumpe, Wedemark, DE;

Hannes Frischat, Hannover, DE;

Franz-Otto Kopp, Hannover, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 72 ; 356371 ; 3562372 ;
Abstract

A device for examining the smoothness of a sample surface includes a scattered-light instrument for scanning the surface with a focused laser beam and for detecting scattered light which is reflected during the scanning of the surface. There is also an instrument for microscopic examination of prominently light-scattering regions of the surface after they have been identified using the scattered-light instrument. This device has an evacuable sample chamber, in which the sample is placed on a sample holder and which has a transparent window through which the laser beam passes before it strikes the surface of the sample. There is also a method for examining a sample using the device.


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