Company Filing History:
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1 out of 1 Years Active: 2010-2020
Title: The Innovative Vision of Han Cheng Ge in Semiconductor Inspection
Introduction
Han Cheng Ge is a prominent inventor based in Singapore, SG, with a remarkable portfolio of six patents. His work primarily focuses on advancements in the semiconductor industry, emphasizing the importance of precision and efficiency in wafer inspection systems. Han is known for his innovative approach and dedication to enhancing technology in this critical sector.
Latest Patents
One of Han Cheng Ge's latest innovations is a comprehensive system and method for inspecting semiconductor wafers. This sophisticated inspection system features a unique illumination setup that provides broadband illumination. The system can adapt to different contrasts, including brightfield and darkfield broadband illumination, which are essential for effective imaging. The inspection process utilizes two image capture devices that receive the broadband illumination while the semiconductor wafers are in motion. The incorporation of several tube lenses enhances the collimation of light, while a stabilizing mechanism and an objective lens assembly improve the inspection's overall accuracy. Furthermore, the system employs a thin line illumination emitter and a third image capture device to create three-dimensional images of wafers. A reflector assembly is also integral to the system, allowing for the reception of illumination reflected in multiple directions, thereby providing comprehensive data about the wafer’s surface.
Career Highlights
Han Cheng Ge's career is marked by significant contributions to the field of semiconductor technology. He has worked for notable companies such as Semiconductor Technologies & Instruments Pte. Ltd. and Asti Holdings Limited, where he has honed his skills and collaborated on various innovative projects. His extensive experience in these companies has enabled him to refine his techniques and improve the efficiency of semiconductor inspections.
Collaborations
Throughout his career, Han has collaborated with talented professionals, including Ajharali Amanullah and Kok Weng Wong. These collaborations have fostered a creative environment that encourages innovation and the sharing of expertise, driving advancements in semiconductor inspection technology.
Conclusion
Han Cheng Ge is a distinguished inventor whose contributions to semiconductor wafer inspection are invaluable. With his six patents and a strong collaborative spirit, Han continues to push the boundaries of innovation within the semiconductor industry. His work not only enhances the efficiency of technology but also paves the way for future breakthroughs in this essential field.