The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Apr. 29, 2015
Applicant:

Generic Power Ptd Ltd, Singapore, SG;

Inventors:

Kok Weng Wong, Singapore, SG;

Albert Archwamety, Singapore, SG;

Han Cheng Ge, Singapore, SG;

Ruini Cao, Singapore, SG;

Assignee:

GENERIC POWER PTD LTD, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); G01B 11/06 (2006.01); G06T 7/521 (2017.01); H04N 7/18 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); G06T 7/521 (2017.01); H04N 7/183 (2013.01); G01B 11/25 (2013.01);
Abstract

The present disclosure provides a system and method to convert three-dimensional data into a two-dimensional height displacement map and extract the three-dimensional features and dimensions of a three-dimensional object using a two-dimensional image processing technique. An illumination source of the system scans across the workspace using a line laser and generates a two-dimensional height displacement map of the workspace. The individual pixel location represents an actual workspace sampled location. The pixel gray scale intensity represents the Z displacement height at the pixel location. A processing device processes the features and dimensions within two-dimensional image as a gray scale using two-dimensional image processing such as pattern match, blob, convolution and edge detection.


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