This inventor holds 2 USPTO granted patents. Top assignee: Chinese Academy of Sciences. Active years: 2020-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020-2021
Title: Innovations of Haiyang Quan in Optical Detection Technology
Introduction
Haiyang Quan is a notable inventor based in Sichuan, China. He has made significant contributions to the field of optical detection technology, holding a total of 2 patents. His work focuses on developing advanced methods and apparatuses for detecting flaws in optical elements.
Latest Patents
Haiyang Quan's latest patents include a "Flaw Detecting Apparatus" and a "Method for Detecting Flaw of Plane Mirror Based on Line Scanning and Ring Band Stitching." This innovative apparatus comprises a line scanning detector, an annular illumination source, a rotary table, a translation table, and a processor. By translating and rotating the plane mirror, the entire surface can be detected, significantly improving detection speed and quality. Another patent involves an "Automatic Detection Device and Method for Detecting Surface Defects of Large Caliber Cambered Optical Element." This device includes a sensor measuring head, a rotatable workpiece table, an automatic sampling device, and a spraying device, effectively addressing the challenges of detecting surface defects in large optical elements.
Career Highlights
Haiyang Quan is affiliated with the Chinese Academy of Sciences, where he continues to advance research in optical detection technologies. His innovative approaches have garnered attention in the scientific community, contributing to improved methodologies in the field.
Collaborations
He has collaborated with notable colleagues, including Fuchao Xu and Taotao Fu, enhancing the research and development efforts within his team.
Conclusion
Haiyang Quan's contributions to optical detection technology exemplify the impact of innovative thinking in addressing complex challenges. His patents reflect a commitment to enhancing detection methods, ultimately benefiting various applications in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
