The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Nov. 07, 2019
The Institute of Optics and Electronics, the Chinese Academy of Sciences, Sichuan, CN;
Haiyang Quan, Sichuan, CN;
Fuchao Xu, Sichuan, CN;
Taotao Fu, Sichuan, CN;
Xiaochuan Hu, Sichuan, CN;
Gaofeng Wu, Sichuan, CN;
Xi Hou, Sichuan, CN;
Fan Wu, Sichuan, CN;
Sheng Li, Sichuan, CN;
Abstract
Embodiments of the present disclosure relate to a measuring method and device for measuring surface defects of a cambered optical element, which belongs to the field of photoelectric detection technology. The device includes a sensor measuring head, a rotatable workpiece table, an automatic sampling device, and a spraying device. The sensor measuring head includes an illumination sub-system and a line scan imaging sub-system, the illumination sub-system provides an illumination of high uniformity and high brightness for a surface of a sample to be detected, the rotatable workpiece table and the imaging sub-system are configured for performing a ring belt scanning and a high resolution scatter imaging to the defects on an optical surface region. The automatic sampling device is used as a mechanical arm in an automatic production for automatically clamping optical elements; the spraying device is activated once foreign matters such as dust and impurities are detected on the surface, so as to accurately remove false defects such as dust and impurities on the surface of the piece to be detected. Embodiments of the present disclosure effectively solve the problem that the surface defect detection of the large caliber optical element is difficult and the efficiency thereof is low, and can quickly measure surface defects of a large caliber planar, spherical and cambered optical element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile