Company Filing History:
2 out of 77 
2 out of 10 Years Active: 2025
Title: Haijun Shen: Innovator in Reconfigurable Testing Methods
Introduction
Haijun Shen is a prominent inventor based in Jiangsu, China, known for his contributions to the field of testing methods in integrated circuits. With a total of two patents to his name, he has made significant advancements that enhance the efficiency and effectiveness of testing processes.
Latest Patents
One of his latest patents is the "Reconfigurable MBIST method based on adaptive march algorithm." This innovative method allows for the automatic reconfiguration of different algorithm circuits based on external environments and user instructions. It aims to meet detection requirements for various faults. The adaptive March algorithm he developed can reorganize algorithms of varying complexities, enabling dynamic adjustments between time complexities and fault coverage rates. This results in a high static fault coverage rate and improved dynamic fault coverage rates.
Another notable patent is the "Circuit and method for post-binding testing of 2.5D chiplet." This invention includes an interposer-dedicated TAP controller, an interposer test interface circuit, and a chiplet test output control circuit. It introduces a chiplet test configuration register that works in conjunction with the TAP controller. The interposer test interface circuit utilizes a control signal from the configuration register to manage the test signal channel between the interposer and the chiplet, thereby enhancing the testing process.
Career Highlights
Haijun Shen has worked at notable institutions such as Nanjing University of Posts and Telecommunications and the Nantong Institute of Nanjing University of Posts and Telecommunications Co., Ltd. His work in these organizations has contributed to his expertise in the field of integrated circuit testing.
Collaborations
Throughout his career, Haijun has collaborated with esteemed colleagues, including Zhikuang Cai and Jiafei Yao. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Haijun Shen's contributions to the field of testing methods for integrated circuits demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to improving fault detection and testing efficiency, marking him as a significant figure in the realm of technology.
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