Nanjing University of Posts and Telecommunicatins

Nantong Institute of Nanjing University of Posts and Telecommunications Co.,ltd.

Haijun Shen

Jian Xiao

Yufeng Guo

Zhikuang Cai

Zixuan Wang

Jiafei Yao

Henglu Wang

Zushuai Xie

Jingjing Guo

Binbin Xu

Lu Liu

Guopeng Zhou

Haojie Yu

A reconfigurable MBIST method based on an adaptive March algorithm is provided. The reconfigurable MBIST method automatically reconfigures different algorithm circuits according to external environment and user instructions to satisfy detection requirements for different faults. The provided adaptive March algorithm is capable of adaptively reorganizing algorithms with different complexities, such that dynamic adjustments can be executed between time complexities of the algorithm and fault coverage rates to achieve a good balance, and the static fault coverage rates are high, thereby effectively improving dynamic fault coverage rates.

Reconfigurable MBIST method based on adaptive march algorithm

A circuit for post-binding testing of a 2.5D chiplet includes an interposer-dedicated TAP controller, an interposer test interface circuit and a chiplet test output control circuit. A chiplet test configuration register and its corresponding instructions are newly added for the interposer-dedicated TAP controller. The interposer test interface circuit uses an output control signal of the chiplet test configuration register to select the opening or closing of a test signal channel between an interposer and a chiplet. The chiplet test output control circuit uses the chiplet test configuration register to output a control signal for control of a test data output of the chiplet on the interposer.

Circuit and method for post-binding testing of 2.5D chiplet

Growing community of inventors

Jiangsu, China

Haijun Shen