Cupertino, CA, United States of America

Guowu Zheng


 

Average Co-Inventor Count = 5.2

ph-index = 2

Forward Citations = 26(Granted Patents)


Location History:

  • Cupertino, CA (US) (2014 - 2017)
  • San Jose, CA (US) (2019)

Company Filing History:


Years Active: 2014-2019

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6 patents (USPTO):Explore Patents

Title: Guowu Zheng: Innovator in Imaging Technology

Introduction

Guowu Zheng is a prominent inventor based in Cupertino, CA (US), known for his significant contributions to imaging technology. With a total of 6 patents, Zheng has developed innovative solutions that enhance the capabilities of image sensors and inspection systems.

Latest Patents

One of Zheng's latest patents is focused on dark-field inspection using a low-noise sensor. This invention involves an inspection system and methods where analog image data values captured by an image sensor are binned before or during transmission as output signals. The system utilizes an ADC that generates multiple corresponding digital image data values sequentially between resets of the output sensing nodes. Additionally, Zheng has developed a TDI imaging system with variable voltage readout clock signals. This system employs clock signals with progressively increasing amplitudes based on pixel row location, optimizing the transfer of image-related charges throughout the TDI imaging process.

Career Highlights

Throughout his career, Guowu Zheng has worked with notable companies, including Kla Tencor Corporation and KLA-Tencor Corporation. His work has significantly impacted the field of imaging technology, leading to advancements that improve the efficiency and accuracy of image processing.

Collaborations

Zheng has collaborated with esteemed colleagues such as David Lee Brown and Venkatraman Iyer, contributing to the development of innovative imaging solutions.

Conclusion

Guowu Zheng's contributions to imaging technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in image sensor technology and inspection systems.

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