Guopeng Zhou

Title: Guopeng Zhou: Innovator in Semiconductor Testing Technologies

Introduction

Guopeng Zhou is a notable inventor based in Jiangsu, China, recognized for his contributions to semiconductor testing technologies. With a total of three patents to his name, Zhou has made significant advancements in the field, particularly in the testing of chiplets.

Latest Patents

Zhou's latest patents include a "Circuit and method for post-binding testing of 2.5D chiplet." This invention features an interposer-dedicated TAP controller, an interposer test interface circuit, and a chiplet test output control circuit. The design introduces a chiplet test configuration register, which allows for the selection of test signal channels between an interposer and a chiplet. Another significant patent is the "Serial test circuit for controllable Chiplets." This circuit is essential for testing semiconductor devices during manufacturing, comprising a master control test module, a slave control test module, and a clock controlling module.

Career Highlights

Guopeng Zhou has worked at esteemed institutions such as Nanjing University of Posts and Telecommunications and the Nantong Institute of Nanjing University of Posts and Telecommunications Co., Ltd. His work in these organizations has contributed to his expertise in semiconductor technologies and testing methodologies.

Collaborations

Zhou has collaborated with notable colleagues, including Zhikuang Cai and Binbin Xu, enhancing his research and development efforts in the semiconductor field.

Conclusion

Guopeng Zhou's innovative work in semiconductor testing technologies has positioned him as a key figure in the industry. His patents reflect a commitment to advancing the efficiency and effectiveness of chiplet testing processes.