The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Oct. 20, 2022
Nanjing University of Posts and Telecommunications, Jiangsu, CN;
Nantong Institute of Nanjing University of Posts and Telecommunications Co., Ltd., Jiangsu, CN;
Zhikuang Cai, Jiangsu, CN;
Jian Song, Jiangsu, CN;
Guopeng Zhou, Jiangsu, CN;
Zushuai Xie, Jiangsu, CN;
Henglu Wang, Jiangsu, CN;
Binbin Xu, Jiangsu, CN;
Jiafei Yao, Jiangsu, CN;
Zixuan Wang, Jiangsu, CN;
Yufeng Guo, Jiangsu, CN;
Abstract
The present disclosure relates to the field of design for testability of super-large-scale integrated circuits, and discloses a flexible configurable module (FCM) based chiplet test circuit. The core structure of the circuit is located at an interposer. The test circuit includes FCMs, a control signal configuration module and a test state control module, where the FCM adopts a two-way skew-symmetric structure to implement data transmission in the horizontal direction and the vertical direction; the control signal configuration module is connected to control signals of all the FCMs, so as to control the data transmission directions as well as switch on and switch off states of all the FCMs; and the test state control module controls the shift and update operations of data inside the FCMs and the control signal configuration module.