Jian Song

Title: Innovations of Jian Song in Semiconductor Testing

Introduction

Jian Song is a notable inventor based in Jiangsu, China, recognized for his contributions to the field of semiconductor testing. With a total of three patents to his name, he has made significant advancements in the design and functionality of test circuits for semiconductor devices.

Latest Patents

One of Jian Song's latest patents is the "Serial test circuit for controllable Chiplets." This invention pertains to the technical field of testing or measuring semiconductor devices during manufacturing or processing. The test circuit comprises a master control test module, a slave control test module, a clock controlling module, and an outputting module. The master control test module includes a test access port module, a segment insertion bit module, and a test data register module. The test controlling signal is generated by the master control test module, which subsequently controls the test input signals of the slave Chiplets. Additionally, the clock controlling module receives the test controlling signal to generate clock signals for the slave Chiplets, while the output signal of the test outputting module is determined by the test controlling signal.

Another significant patent is the "FCM based chiplet test circuit." This invention relates to the design for testability of super-large-scale integrated circuits. It discloses a flexible configurable module (FCM) based chiplet test circuit, with the core structure located at an interposer. The test circuit includes FCMs, a control signal configuration module, and a test state control module. The FCM adopts a two-way skew-symmetric structure to facilitate data transmission in both horizontal and vertical directions. The control signal configuration module connects to the control signals of all FCMs, allowing for the management of data transmission directions and the on/off states of the FCMs. The test state control module oversees the shift and update operations of data within the FCMs and the control signal configuration module.

Career Highlights

Jian Song has worked at prominent institutions, including Nanjing University of Posts and Telecommunications and the Nantong Institute of Nanjing University of Posts and Telecommunications. His work in these organizations has contributed to his expertise in semiconductor technology and testing methodologies.

Collaborations

Jian has collaborated with notable colleagues such as Zhikuang Cai and Guopeng Zhou, enhancing his research and development efforts in the field of semiconductor testing.

Conclusion

Jian