Guo Chang Man

Title: Guo Chang Man: Innovator in Semiconductor Testing

Introduction

Guo Chang Man is a notable inventor based in Singapore, recognized for his contributions to the field of semiconductor technology. With a focus on enhancing testing methodologies, he has developed innovative solutions that improve the accuracy of semiconductor device evaluations.

Latest Patents

Guo Chang Man holds a patent for a "Method and system for introducing physical damage into an integrated circuit device for verifying testing program and its results." This patent outlines a method that verifies bitmap information or test data for a semiconductor device. The process involves placing a defect on a semiconductor device at an actual defect location using a laser to physically damage the device. By detecting a logical address associated with the defect, the method reviews bitmap information or test data to determine an expected location corresponding to the logical address. The accuracy of the bitmap information or test data is then assessed by comparing the actual defect location with the expected location, where any deviation indicates an inaccuracy.

Career Highlights

Guo Chang Man is currently employed at Globalfoundries Singapore Pte. Ltd., where he applies his expertise in semiconductor technology. His work focuses on improving testing processes and ensuring the reliability of semiconductor devices.

Collaborations

Guo has collaborated with several professionals in his field, including Zhihong Mai and Pik Kee Tan. These collaborations have contributed to advancements in semiconductor testing methodologies.

Conclusion

Guo Chang Man's innovative approach to semiconductor testing exemplifies the importance of accuracy in technology development. His contributions continue to influence the industry and enhance the reliability of semiconductor devices.