The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Oct. 12, 2010
Zhihong Mai, Singapore, SG;
Pik Kee Tan, Singapore, SG;
Guo Chang Man, Singapore, SG;
Jeffrey Lam, Singapore, SG;
Liang Choo Hsia, Singapore, SG;
Zhihong Mai, Singapore, SG;
Pik Kee Tan, Singapore, SG;
Guo Chang Man, Singapore, SG;
Jeffrey Lam, Singapore, SG;
Liang Choo Hsia, Singapore, SG;
Globalfoundries Singapore Pte, Ltd., Singapore, SG;
Abstract
According to an embodiment of the disclosure, a method verifies bitmap information or test data information for a semiconductor device. The method places a defect on a semiconductor device at an actual defect location using a laser to physically damage the semiconductor device. A logical address associated with the defect is detected and bitmap information or test data information is reviewed to determine an expected location corresponding to the logical address. Then, the accuracy of the bitmap information or the test data information is determined by comparing the actual defect location with the expected location. A deviation between the two indicates an inaccuracy.