Company Filing History:
Years Active: 2020-2022
Title: Innovations by Guan-Jhih Liou
Introduction
Guan-Jhih Liou is a prominent inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of wafer inspection and probing systems. With a total of 6 patents to his name, his work has advanced the technology used in semiconductor manufacturing.
Latest Patents
Liou's latest patents include a wafer inspection method and a control method for touch display apparatuses. The wafer inspection method involves a motorized chuck stage that is controlled by a control rod, allowing for precise positioning of a wafer relative to a probe. This method enhances the accuracy of wafer inspections by determining the position of the control rod based on measurement signals and adjusting the motorized chuck stage accordingly.
The control method for a touch display apparatus is designed for use in a probe station. It features a movable element, such as a chuck stage or camera stage, and allows for real-time interaction through a touch interface. This innovation improves the efficiency of operations by enabling the movable element to respond directly to touch instructions.
Career Highlights
Guan-Jhih Liou is currently employed at Mpi Corporation, where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in wafer inspection and probing systems has positioned him as a key figure in his field.
Collaborations
Liou collaborates with talented coworkers, including Lin-Lin Chih and Chien-Hung Chen. Their combined efforts contribute to the innovative projects at Mpi Corporation.
Conclusion
Guan-Jhih Liou's contributions to wafer inspection and probing systems demonstrate his commitment to advancing technology in the semiconductor industry. His innovative patents reflect his expertise and dedication to improving manufacturing processes.