Milpitas, CA, United States of America

Graham Jensen


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Graham Jensen: Innovator in Deep Learning for Inspection Systems

Introduction

Graham Jensen is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of deep learning, particularly in the context of inspection systems. His innovative approach has led to the development of methods and systems that enhance defect detection processes.

Latest Patents

Graham holds a patent titled "Deep learning based mode selection for inspection." This patent involves methods and systems for determining information for a specimen. The system includes a computer subsystem and components executed by the computer subsystem, which feature a setup deep learning (DL) model. This model is configured to perform defect detection for a specimen based on outputs generated by various modes of an inspection system. The computer subsystem determines differences between results of defect detections for each mode and identifies candidate modes for inspection based on these differences. Graham's innovative work in this area has the potential to significantly improve inspection accuracy and efficiency.

Career Highlights

Graham is currently employed at Kla Corporation, where he continues to develop cutting-edge technologies. His work focuses on integrating deep learning techniques into practical applications, particularly in the manufacturing and inspection sectors. With a patent portfolio that includes 1 patent, he is recognized for his contributions to advancing technology in his field.

Collaborations

Graham collaborates with talented individuals such as Rajkumar Theagarajan and Yujie Dong. Their combined expertise fosters an environment of innovation and creativity, leading to the development of advanced solutions in inspection systems.

Conclusion

Graham Jensen is a pioneering inventor whose work in deep learning for inspection systems is making a significant impact in the industry. His innovative patent and collaborations highlight his commitment to advancing technology and improving inspection processes.

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