Company Filing History:
Years Active: 2014-2021
Title: The Innovations of Gordon Yue
Introduction
Gordon Yue is a prominent inventor based in Sunnyvale, CA, known for his contributions to electrical inspection technologies and thermal management systems. With a total of 3 patents, he has made significant strides in enhancing the efficiency and effectiveness of various technological applications.
Latest Patents
One of Gordon Yue's latest patents is titled "Systems and methods for electrical inspection of flat panel displays using cell contact probing pads." This innovative probe system facilitates the inspection of devices under test by incorporating a configurable universal probe bar with multiple probe blocks. These blocks contain probe pins designed to simultaneously engage with cell contact pads, delivering essential electrical test signals.
Another notable patent is "Thermal management systems, assemblies and methods for grazing incidence collectors for EUV lithography." This patent outlines a thermal management assembly that includes a grazing incidence collector (GIC) mirror shell interfaced with a jacket to create a sealed chamber. The assembly utilizes an open cell, heat transfer material to effectively manage cooling in GIC mirror systems, which are crucial for EUV lithography applications.
Career Highlights
Throughout his career, Gordon Yue has worked with several notable companies, including Media Lario S.r.l. and Photon Dynamics, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in the field.
Collaborations
Gordon has collaborated with esteemed colleagues such as Giovanni Bianucci and Lloyd Russell Jones. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Gordon Yue's work exemplifies the spirit of innovation in the field of electrical inspection and thermal management. His patents reflect a commitment to advancing technology and improving industry standards.