The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Nov. 22, 2016
Systems and methods for electrical inspection of flat panel displays using cell contact probing pads
Photon Dynamics, Inc., San Jose, CA (US);
Gordon Yue, Sunnyvale, CA (US);
Lloyd Russell Jones, Los Gatos, CA (US);
Neil Dang Nguyen, Milpitas, CA (US);
Kiran Jitendra, San Jose, CA (US);
Kent Nguyen, San Jose, CA (US);
Steven Aochi, Morgan Hill, CA (US);
Abstract
A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.