Coquitlam, Canada

Glenn Harrison Chapman

This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignees: Creo Srl, Simon Fraser University. Active years: 2003-2011.


% Patents Active = 50.0


Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2003-2011

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2 patents (USPTO):Explore Patents

Title: Glenn Harrison Chapman: Innovator in Imaging Technology

Introduction

Glenn Harrison Chapman is a notable inventor based in Coquitlam, Canada. He has made significant contributions to the field of imaging technology, holding a total of 2 patents. His work focuses on methods and apparatus for detecting defects in imaging arrays, showcasing his expertise in this specialized area.

Latest Patents

Chapman's latest patents include innovative methods for detecting defective pixels in imaging arrays. These methods involve establishing probabilities that individual pixels are defective and updating those probabilities by analyzing images acquired by the imaging arrays. The techniques can detect various defect conditions, including stuck-low, stuck-high, high-sensitivity, low sensitivity, hot, and defect-free conditions. Additionally, he has developed a dry multilayer inorganic alloy thermal resist for lithographic processing and image creation. This thermal inorganic resist allows for the replication of patterns projected on its surface, enhancing exposure control in lithographic processes.

Career Highlights

Throughout his career, Glenn Harrison Chapman has worked with esteemed organizations such as Simon Fraser University and Creo Srl. His experience in these institutions has contributed to his development as an inventor and innovator in the field of imaging technology.

Collaborations

Chapman has collaborated with notable individuals in his field, including Marinko Venci Sarunic and Yugiang Tu. These partnerships have likely enriched his work and expanded the impact of his inventions.

Conclusion

Glenn Harrison Chapman is a distinguished inventor whose contributions to imaging technology have led to significant advancements in defect detection methods and lithographic processes. His innovative patents and collaborations reflect his commitment to enhancing technology in this field.

Profile summary based on public USPTO records.
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