The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Oct. 02, 2006
Glenn Harrison Chapman, Coquitlam, CA;
Israel Koren, Amherst, MA (US);
Zahava Koren, Amherst, MA (US);
Jozsef Dudas, Vancouver, CA;
Cory Jung, Vancouver, CA;
Glenn Harrison Chapman, Coquitlam, CA;
Israel Koren, Amherst, MA (US);
Zahava Koren, Amherst, MA (US);
Jozsef Dudas, Vancouver, CA;
Cory Jung, Vancouver, CA;
Simon Fraser University, Burnaby, British Columbia, CA;
Abstract
Methods for detecting defective pixels in imaging arrays involve establishing probabilities that individual pixels are defective and updating those probabilities by analysing images acquired by the imaging arrays. Probabilities may be evaluated for each of two or more defect conditions. The methods may be used to detect defects such as stuck-low, stuck-high, high-sensitivity, low sensitivity, hot, and defect-free conditions. Other more complicated defect conditions can also be detected. Apparatus for detecting defective pixels may be integrated with a camera or other imaging device or provided separately.