This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2015.
Company Filing History:
Years Active: 2015
Title: Gino Marcuccilli: Innovator in Wafer Inspection Technology
Introduction
Gino Marcuccilli is a notable inventor based in Glasgow, GB. He has made significant contributions to the field of semiconductor technology, particularly in methods for inspecting wafers. His innovative approach has led to advancements in the accuracy and efficiency of wafer inspection processes.
Latest Patents
Gino Marcuccilli holds 1 patent for his invention titled "Inspecting a wafer and/or predicting one or more characteristics of a device being formed on a wafer." This patent outlines methods for acquiring images of multiple die printed on a wafer, which are produced using a double patterning lithography process. The method involves comparing images from die printed at nominal overlay values with those printed at modulated overlay values to detect defects effectively.
Career Highlights
Gino Marcuccilli is currently employed at Kla Tencor Corporation, a leading company in the field of semiconductor inspection and metrology. His work at Kla Tencor has positioned him as a key player in the development of advanced technologies that enhance wafer inspection processes.
Collaborations
Gino has collaborated with talented individuals such as Ellis Chang and Amir Widmann. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Gino Marcuccilli's innovative work in wafer inspection technology exemplifies the impact of dedicated inventors in the semiconductor industry. His contributions continue to shape the future of wafer inspection and device manufacturing.