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For the Inventor, By the Inventor

Jerusalem, Israel

Gil Balog

USPTO Granted Patents = 15 

Average Co-Inventor Count = 1.6

ph-index = 4

Forward Citations = 61(Granted Patents)


Location History:

  • Jerusalem, IL (2008 - 2016)
  • Jerusalum, IL (2018)

Company Filing History:

goldMedal11 out of 12 
 
Optimaltest Ltd.
 patents
silverMedal4 out of 23 
 
Optimal Plus Ltd.
 patents

Years Active: 2008-2018

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15 patents (USPTO):Explore Patents
1. 10118200 - System and method for binning at final test (2018-11-06),
2. 9529036 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2016-12-27),
3. 8872538 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2014-10-28),
4. 8781773 - System and methods for parametric testing (2014-07-15),
5. 8421494 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2013-04-16),
6. 8112249 - System and methods for parametric test time reduction (2012-02-07),
7. 8069130 - Methods and systems for semiconductor testing using a testing scenario language (2011-11-29),
8. 7969174 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2011-06-28),
9. 7777515 - Methods and systems for semiconductor testing using reference dice (2010-08-17),
10. 7737716 - Methods and systems for semiconductor testing using reference dice (2010-06-15),
11. 7679392 - Methods and systems for semiconductor testing using reference dice (2010-03-16),
12. 7567947 - Methods and systems for semiconductor testing using a testing scenario language (2009-07-28),
13. 7532024 - Methods and systems for semiconductor testing using reference dice (2009-05-12),
14. 7528622 - Methods for slow test time detection of an integrated circuit during parallel testing (2009-05-05),
15. 7340359 - Augmenting semiconductor's devices quality and reliability (2008-03-04),

Title: The Innovations of Gil Balog: A Pioneer in Semiconductor Testing

Introduction

Gil Balog is an accomplished inventor based in Jerusalem, Israel, known for his groundbreaking innovations in the field of semiconductor testing. With a portfolio of 15 patents to his name, Balog’s contributions significantly impact the efficiency and reliability of electronic device testing.

Latest Patents

Among his latest patents, Balog developed a "System and method for binning at final test." This innovation specializes in sorting electronic devices undergoing final tests according to a defined test program, effectively categorizing them into one of several bins. In one embodiment, an evaluator shapes the binning of the electronic device while it remains socketed, which may differ from the test program's preassigned binning.

Another notable patent is titled "Systems and methods for test time outlier detection and correction in integrated circuit testing." This invention focuses on methodologies that improve semiconductor testing efficiency by preventing devices that are testing too slowly from completing the process, enabling untested devices to begin their testing sooner.

Career Highlights

Throughout his career, Gil Balog has made significant strides while working with leading technology companies such as OptimalTest Ltd. and Optimal Plus Ltd. His expertise and innovative mind have allowed him to contribute to the advancement of testing methodologies within the semiconductor industry.

Collaborations

Balog has collaborated with talented individuals including Reed Linde and Avi Golan, both of whom have played vital roles in enhancing the scope and impact of Balog's work. These collaborations highlight the importance of teamwork in the innovation process and underscore the value of diverse expertise in achieving groundbreaking developments.

Conclusion

In conclusion, Gil Balog's contributions to the field of semiconductor testing exemplify the spirit of innovation. With his remarkable portfolio of patents and significant career milestones, Balog continues to be a driving force for advancements in technology. His work not only elevates industry standards but also paves the way for future breakthroughs in electronic device testing.

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