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Forward Citations = 58

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6 inventors (with patents filed for the assignee):

Gil Balog (11 out of 15 patents)

Avi Golan (4 out of 6 patents)

Reed Linde (3 out of 12 patents)

4. Alexander Chufarovsky (1 out of 3 patents)

5. Leonid Gurov (1 out of 5 patents)

6. Nir Erez (1 out of 1 patent)

12 patents: Sort by Forward Citations

1. 8421494 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2013-04-16),

2. 8112249 - System and methods for parametric test time reduction (2012-02-07),

3. 8069130 - Methods and systems for semiconductor testing using a testing scenario language (2011-11-29),

4. 7969174 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2011-06-28),

5. 7777515 - Methods and systems for semiconductor testing using reference dice (2010-08-17),

6. 7737716 - Methods and systems for semiconductor testing using reference dice (2010-06-15),

7. 7679392 - Methods and systems for semiconductor testing using reference dice (2010-03-16),

8. 7567947 - Methods and systems for semiconductor testing using a testing scenario language (2009-07-28),

9. 7532024 - Methods and systems for semiconductor testing using reference dice (2009-05-12),

10. 7528622 - Methods for slow test time detection of an integrated circuit during parallel testing (2009-05-05),

11. 7340359 - Augmenting semiconductor's devices quality and reliability (2008-03-04),

12. 7208969 - Optimize parallel testing (2007-04-24),

OptimalTest Ltd. is a leading provider of advanced test solutions for semiconductor manufacturing. Our innovative technology and expertise enable semiconductor manufacturers to optimize their testing processes, increase production yields, and reduce time-to-market. With a comprehensive suite of test solutions, ranging from test program management to final product quality assurance, we help our customers achieve maximum efficiency and profitability in the ever-evolving semiconductor industry.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

12 Patents

#1 in Nes-zionna

#495 in Israel

#46,735 in the World

Nes-zionna, Israel

Optimaltest Ltd.