Forward Citations = 58

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6 inventors (with patents filed for the assignee):

Gil Balog (11 out of 15 patents)

Avi Golan (4 out of 6 patents)

Reed Linde (3 out of 12 patents)

4. Alexander Chufarovsky (1 out of 3 patents)

5. Leonid Gurov (1 out of 5 patents)

6. Nir Erez (1 out of 1 patent)

12 patents: Sort by Forward Citations

1. 8421494 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2013-04-16),

2. 8112249 - System and methods for parametric test time reduction (2012-02-07),

3. 8069130 - Methods and systems for semiconductor testing using a testing scenario language (2011-11-29),

4. 7969174 - Systems and methods for test time outlier detection and correction in integrated circuit testing (2011-06-28),

5. 7777515 - Methods and systems for semiconductor testing using reference dice (2010-08-17),

6. 7737716 - Methods and systems for semiconductor testing using reference dice (2010-06-15),

7. 7679392 - Methods and systems for semiconductor testing using reference dice (2010-03-16),

8. 7567947 - Methods and systems for semiconductor testing using a testing scenario language (2009-07-28),

9. 7532024 - Methods and systems for semiconductor testing using reference dice (2009-05-12),

10. 7528622 - Methods for slow test time detection of an integrated circuit during parallel testing (2009-05-05),

11. 7340359 - Augmenting semiconductor's devices quality and reliability (2008-03-04),

12. 7208969 - Optimize parallel testing (2007-04-24),

Company Overview

Optimaltest Ltd. is a technology company based in Nes-Ziona, Israel, specializing in advanced testing solutions for semiconductor and electronic devices. The organization focuses on developing innovative software and hardware tools that enhance the efficiency and reliability of testing processes in the electronics industry. With a commitment to quality and precision, Optimaltest aims to support manufacturers in optimizing their production workflows and ensuring the performance of their products in a competitive market.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

12 Patents

#4 in Nes-Ziona

#520 in Israel

#48,129 in the World

Nes-Ziona, Israel

Optimaltest Ltd.

Forward Citations = 58

6 inventors:

Gil Balog (11 out of 15 patents)

Avi Golan (4 out of 6 patents)

Reed Linde (3 out of 12 patents)

4. Alexander Chufarovsky (1 out of 3 patents)

5. Leonid Gurov (1 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Optimaltest Ltd.. Retrieved from https://idiyas.com/company/optimaltest

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]