The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Dec. 28, 2006
Applicants:
Gil Balog, Jerusalem, IL;
Reed Linde, El Dorado Hills, CA (US);
Avi Golan, Tel Aviv, IL;
Inventors:
Assignee:
Optimal Test Ltd., Nes-Zionna, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
Balog, Gil. (2009). Methods for slow test time detection of an integrated circuit during parallel testing (U.S. Patent No. 7528622). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7528622
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile