Hoehenkirchen-Siegertsbrunn, Germany

Gerd Frankowsky

This inventor holds 46 USPTO granted patents and 1 EPO patent, primarily in Semiconductor Testing. Top assignees: Infineon Technologies Ag, Infineon Technologies North America Corp., Infineon Technologies LLC. Active years: 2001-2009.


% Patents Active = 50.0


Average Co-Inventor Count = 1.6

ph-index = 8

Forward Citations = 385(Granted Patents)


Location History:

  • Wappingers Falls, NY (US) (2001 - 2003)
  • Munich, DE (2003)
  • Höhenkirchen-Siegertsbrunn, DE (2002 - 2006)
  • Taufkirchen, DE (2004 - 2006)
  • Hohenkirchen-Siegertsbrunn, DE (2005 - 2007)
  • Höhenkirchen-Sipyertsbrunn, DE (2007)
  • Hoehenkirchen-Siegertsbrunn, DE (2003 - 2008)
  • Höhenkirchen, DE (2004 - 2008)
  • Hoehenkirchen, DE (2007 - 2008)
  • Siegertsbrunn, DE (2009)

Company Filing History:


Years Active: 2001-2009

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Areas of Expertise:
Integrated Circuit
Test System
Memory Device
Semiconductor Package
Calibration Device
Fuse Programmable I/O
Dynamic Memory Refresh
Solder-Free PCB
Error Detection
Circuit Configuration
Chip Arrangement
Voltage Generator
46 patents (USPTO):Explore Patents

Title: The Innovative Mind of Gerd Frankowsky

Introduction: Gerd Frankowsky, based in Höhenkirchen-Siegertsbrunn, Germany, is an accomplished inventor with an impressive portfolio of 46 patents to his name. His innovative contributions, particularly in the fields of monitoring and memory technologies, showcase his commitment to advancing technological solutions.

Latest Patents: Among Gerd Frankowsky's recent patents are two notable inventions. The first is an "Apparatus and method for monitoring a state, in particular of a fuse." This invention provides a comprehensive apparatus for monitoring a fuse's state, incorporating a first state storage device and a second state storage device, along with a logic device for comparing the states. Additionally, it includes a mechanism for renewing the reading of the state when discrepancies arise between the two state stores. The second recent patent is a "Method and test device for determining a repair solution for a memory module." This method involves successively testing memory areas within a memory module to ascertain defect data and subsequently generating defect addresses to determine effective repair solutions.

Career Highlights: Gerd Frankowsky has had a fruitful career, having worked with prominent organizations such as Infineon Technologies AG and Infineon Technologies North America Corporation. His work within these companies has greatly influenced the development of semiconductor technologies and memory solutions.

Collaborations: Throughout his career, Frankowsky has collaborated with esteemed professionals like Hartmud Terletzki and Gunther Lehmann. These collaborations have fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion: Gerd Frankowsky's contributions to the fields of monitoring systems and memory technologies highlight not only his inventive spirit but also his impact on the technological landscape. With a robust portfolio of patents and a successful career, he continues to inspire future generations of inventors and innovators.

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