Palo Alto, CA, United States of America

Gerard H Vurens

This inventor holds 6 USPTO granted patents and 2 published patent applications. Top assignees: Hdi Instrumentation, Crystal Technology, Inc., Other. Active years: 1999-2010.

USPTO Granted Patents = 6 

% Patents Active = 83.3

Average Co-Inventor Count = 1.6

ph-index = 5

Forward Citations = 183(Granted Patents)


Company Filing History:


Years Active: 1999-2010

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6 patents (USPTO):Explore Patents

Title: Innovations of Gerard H Vurens

Introduction

Gerard H Vurens is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of surface analysis and detection technologies. With a total of six patents to his name, Vurens has developed innovative methods that enhance the understanding and quality control of non-semiconductor materials.

Latest Patents

One of his latest patents is titled "Systems and methods for detecting scratches on non-semiconductor wafer surfaces." This invention provides a method for detecting scratches on the surface of wafers made from non-semiconductor materials. The method involves producing a UV beam from a UV illumination source, which is then directed onto the wafer's front surface. The UV beam is characterized such that for scratches of a given material, over 90% of the spectral system response is at wavelengths below a specific cutoff. The reflected beam is detected in response to scratches, allowing for effective surface analysis. Another significant patent is "Methods and apparatus for surface analysis," which describes a method and apparatus for creating multi-dimensional non-spatial histograms of surfaces. This analysis is particularly useful for comparing die on wafers to determine conformity to a master or similarity between devices.

Career Highlights

Throughout his career, Gerard H Vurens has worked with various companies, including Hdi Instrumentation. His work has focused on advancing technologies that improve surface analysis and quality control in manufacturing processes.

Collaborations

Vurens has collaborated with notable professionals in his field, including David L Klein and Yun-Biao Xin. These collaborations have contributed to the development of his innovative patents and advancements in surface analysis technologies.

Conclusion

Gerard H Vurens is a distinguished inventor whose work has significantly impacted the field of surface analysis and detection technologies. His innovative patents demonstrate his commitment to enhancing quality control in manufacturing processes.

Profile summary based on public USPTO records.
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