Georges Guernet

Title: The Innovations of Georges Guernet

Introduction

Georges Guernet is a notable inventor based in Grenoble, France. He has made significant contributions to the field of semiconductor technology, particularly in the development of measuring detectors and methods for particle implantation.

Latest Patents

Georges Guernet holds 2 patents. His latest patents include a measuring detector and a method of fabrication of said detector. The measuring detector is constituted by the resistance of a given volume of doped semiconductor. A surface region with a well-determined thickness and concentration of doping ions is formed on one face of a semiconducting monocrystal, with two electrical contacts at the extremities of this region. The doped surface region is obtained through ion implantation, and a metallic coating with good thermal conductivity is formed on the second face of the monocrystal. This detector is primarily applicable to thermometric measurements at very low temperatures below 1 K. Additionally, he has developed a method and device for the implantation of particles into a substrate. This process involves directing a particle beam onto a target and sweeping the beam in two perpendicular directions, allowing for effective implantation.

Career Highlights

Georges Guernet is associated with the Commissariat à l'Énergie Atomique, where he has contributed to various innovative projects. His work has been pivotal in advancing the understanding and application of semiconductor technologies.

Collaborations

Georges has collaborated with notable colleagues such as Jean Bernard and Giorgio Frossati, enhancing the impact of his research through teamwork and shared expertise.

Conclusion

Georges Guernet's contributions to semiconductor technology and his innovative patents reflect his significant role in the field. His work continues to influence advancements in thermometric measurements and particle implantation techniques.