The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 1977

Filed:

Jan. 26, 1972
Applicant:
Inventors:

Jean Bernard, St-Martin D'Heres, FR;

Giorgio Frossati, Grenoble Gare, FR;

Georges Guernet, Grenoble, FR;

Michel Montier, Meylan, FR;

Louise Peccoud nee Toupillier, Claix, FR;

Daniel Thoulouze, Echirolles, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
7336 / ; 2957 / ; 29573 ; 338 25 ;
Abstract

The measuring detector is constituted by the resistance of a given volume of doped semiconductor, there being formed on one face of a semiconducting monocrystal a surface region having a well-determined thickness and a well-determined concentration of doping ions and two electrical contacts at the extremities of said region. The doped surface region is obtained by ion implantation and there is formed on the second face of the monocrystal a metallic coating which has good thermal conductivity and is in good thermal contact with said second face. The detector is primarily applicable to thermometric measurements at very low temperatures below 1.degree. K.


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