This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Carl Zeiss Multisem Gmbh. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Georg Kurij: Advancing Multi-Beam Charged Particle Microscopy.
Introduction
Georg Kurij is an inventor associated with Ulm, Germany, and Carl Zeiss MultiSEM GmbH. His patent work addresses improvements to multi-beam systems used in charged particle microscopes.
Latest Patents
Kurij is associated with 1 patent: “Certain Improvements of Multi-Beam Generating and Multi-Beam Deflecting Units.” The invention concerns the design, fabrication, and adjustment of multi-beam raster units, including apertures with specific shapes and dimensions. These improvements are intended to support more precise multi-beam generation, deflection, and stigmation. They may also help improve reliability, reproducibility, and consistency between machines used in applications such as semiconductor inspection and review.
Career Highlights
Kurij’s patent reflects work on precision components for multi-beam charged particle microscopes. Such systems can be used in semiconductor inspection and other applications that benefit from accurate, repeatable imaging.
Collaborations
Kurij’s listed coworker is Yanko Sarov. His company affiliation is Carl Zeiss MultiSEM GmbH.
Conclusion
Georg Kurij’s patent focuses on practical improvements to multi-beam microscope units, with the goal of enabling more precise and reproducible performance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile