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Naperville, IL, United States of America

Geoffrey Schmit

USPTO Granted Patents = 7

Average Co-Inventor Count = 1.7

ph-index = 5

Forward Citations = 124(Granted Patents)

Location History:

Austin, TX (US) (2000)
Georgetown, TX (US) (2005)
Naperville, IL (US) (2006 - 2011)

Company Filing History:

National Instruments Corporation

Years Active: 2000-2011

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7 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7969431 - Graphical program node for generating a measurement program (2011-06-28),

2. 7512931 - Graphical program nodes for implementing a measurement state model (2009-03-31),

3. 7089141 - Measurement system which uses a state model (2006-08-08),

4. 6965800 - System of measurements experts and method for generating high-performance measurements software drivers (2005-11-15),

5. 6944606 - Measurements expert system and method for generating high-performance measurements software drivers (2005-09-13),

6. 6879926 - Measurement system software architecture for easily creating high-performance measurement applications (2005-04-12),

7. 6148438 - System and method for creating composite classes for objects having (2000-11-14),

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