The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Jul. 12, 2002
Thomas A. Makowski, Austin, TX (US);
Geoffrey Schmit, Naperville, IL (US);
Thomas A. Makowski, Austin, TX (US);
Geoffrey Schmit, Naperville, IL (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for performing a measurement task. A node is displayed in a graphical program, and configured to receive a measurement task specification (MTS). The node may be coupled to an MTS node, or to a configuration node which constructs the MTS at run time. When the program executes, the node receives the MTS, invokes an expert system to analyze the MTS, optionally validate the MTS, generates a run-time specification for the task. The node them invokes a run-time builder to analyze the run-time specification and generate a run-time based on the run-time specification, where the run-time is executable to perform the measurement task. The node may be a read node, a write node, or a start node connected to a read or write node. Additional operations may be performed prior to or during the first iteration, and/or during or after the last iteration, of the task.