The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Nov. 13, 2001
Geoffrey Schmit, Georgetown, TX (US);
Jonathan Brumley, Austin, TX (US);
Brent Schwan, Austin, TX (US);
Jack Levy, Austin, TX (US);
Geoffrey Schmit, Georgetown, TX (US);
Jonathan Brumley, Austin, TX (US);
Brent Schwan, Austin, TX (US);
Jack Levy, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A measurements expert system and method for generating high-performance measurements software drivers. The measurements expert system is able to interpret a customer's measurement task specification (MTS) specifying a measurement task, explore possible solution paths, and generate a solution, e.g., a run-time specification (RTS), optimized for the customer's measurement system. The expert system includes programs for analyzing and validating a received MTS, and a plurality of measurements experts which are operable to analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences. The final RTS is useable to configure one or more measurement devices according to the RTS, and to generate a run-time which is executable to perform the specified measurement task using the one or more measurement devices.