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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6879926 B1

PDFFull Text
Date of Patent:
Apr. 12, 2005

Filed:

Nov. 13, 2001

Measurement system software architecture for easily creating high-performance measurement applications

Applicants:

Geoffrey Schmit, Georgetown, TX (US);

Brent Schwan, Austin, TX (US);

Jonathan Brumley, Austin, TX (US);

Thomas A. Makowski, Ausin, TX (US);

Christopher T. Bartz, Austin, TX (US);

Inventors:

Geoffrey Schmit, Georgetown, TX (US);

Brent Schwan, Austin, TX (US);

Jonathan Brumley, Austin, TX (US);

Thomas A. Makowski, Ausin, TX (US);

Christopher T. Bartz, Austin, TX (US);

Assignee:

National Instruments Corporation, Austin, TX (US);

Attorneys:

Meyertons Hood Kivlin Kowert & Goetzel, P.C.

Jeffrey C. Hood

Mark S. Williams

Primary Examiner:

Hal Wachsman

Int. Cl.
CPC ...
G06F017/00 ;
U.S. Cl.
CPC ...
Abstract

System and method for creating measurement applications. The system includes a measurement task specifier for generating a measurement task specification (MTS) for a measurement task in response to user input; an expert system for analyzing and validating the generated MTS, and generating a run-time specification (RTS) for the measurement task; a run-time builder for analyzing the RTS, configuring one or more measurement devices according to the RTS, and generating a run-time which is executable to perform the measurement task. The system includes a storage system for storing the generated MTS, the generated RTS, and configuration information for one or more measurement devices. The expert system includes one or more measurement experts which analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences.

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Schmit, Geoffrey. (2005). Measurement system software architecture for easily creating high-performance measurement applications (U.S. Patent No. 6879926). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6879926

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