Richmond, VT, United States of America

Gene T Patrick


Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2002-2008

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4 patents (USPTO):Explore Patents

Title: The Innovations of Gene T Patrick

Introduction

Gene T Patrick is a notable inventor based in Richmond, Vermont, who has made significant contributions to the field of semiconductor testing. With a total of four patents to his name, Patrick has developed innovative solutions that enhance the reliability and efficiency of integrated circuit testing.

Latest Patents

Among his latest patents is a structure for coupling probes of a probe device to corresponding electrical contacts on a product substrate. This apparatus is designed for testing integrated circuit devices and includes a probe device with multiple probes, a product substrate with an array of electrical contacts, and a second substrate that facilitates electrical coupling. Another significant patent is an apparatus for preventing cross talk and interference in semiconductor devices during testing. This invention features a handler that picks up integrated circuits and places them into an automatic circuit test apparatus, while an extraneous signal shield protects the device from stray electromagnetic signals, thereby preventing errors during testing.

Career Highlights

Gene T Patrick is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to focus on advancing technologies related to semiconductor testing and integrated circuits.

Collaborations

Throughout his career, Patrick has collaborated with notable colleagues, including John M Blondin and Michael F Beckett. These collaborations have contributed to the development of innovative testing solutions in the semiconductor industry.

Conclusion

Gene T Patrick's contributions to the field of semiconductor testing through his patents and work at IBM highlight his role as a significant innovator. His inventions continue to impact the efficiency and reliability of integrated circuit testing.

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