The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Jun. 30, 2003
Applicants:

John M. Blondin, Colchester, VT (US);

Gene T. Patrick, Richmond, VT (US);

Kevin M. Potasiewicz, Essex Junction, VT (US);

Inventors:

John M. Blondin, Colchester, VT (US);

Gene T. Patrick, Richmond, VT (US);

Kevin M. Potasiewicz, Essex Junction, VT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a method for testing semiconductor devices such as integrated circuits having a handler for picking up an integrated circuit to be tested and placing the picked up integrated circuit into an automatic circuit test apparatus. When the circuit to be tested is inserted into the test apparatus an extraneous signal shield is automatically engaged to enclose the device being tested and protect the circuit, being tested, from stray extraneous electromagnetic signals during the test thereby preventing said stray electromagnetic interference from inducing errors in the tested circuit.


Find Patent Forward Citations

Loading…